This Panthera TEC offers a high value for the inspection of semiconductors and various other materials, especially in industrial quality control and technical education. Brightfield, Darkfield and Cross-Polarization contrast are combined with a new, unique-to-Motic™ segmental illumination that all contribute to the versatility of this model.
The Panthera TEC is clearly focused on material sciences, filling the last gap in the Panthera family. Brightfield, Darkfield and simple Polarization contrast combined with a new segmental illumination allows for an oblique incident illumination, perfect for detection of scratches or other defects on flat and reflecting surfaces without a need to move the sample.
